西安博尔新材料有限责任公司
西安博尔新材料有限责任公司
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R & D platform

  • Categories:技术力量
  • Time of issue:2019-12-27 00:00:00
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Description:
Information

  ·Purity and trace element analysis of products -- chemical analysis, spectroscopy and assisted X-ray diffraction (XRD)

  ·Particle size distribution and morphology of products -- Malvern laser particle size analyzer, resistance particle counter and image viewer

  ·Detection of crystal structure and shape of products -- X-ray diffraction method (XRD method)

  ·Crystal morphology and microstructure of products -- SEM analysis

  ·Product atomic structure and defects -- STM analysis

  ·Product bulk density powder comprehensive analyzer

  ·Product strength analysis - comprehensive mechanical analyzer

  ·Product thermal conductivity - thermal conductivity tester

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Time of issue:2019-04-29 00:00:00
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